Furthermore, a range of advanced experimental facilities are available, scanning electron microscope (SEM) (with EDX, energy dispersive X-ray analysis), Atomic Force Microscope (AFM), Scanning Tunneling Microscope (STM), Auger electron spectroscopy with sputter-depth-profiling, and a complete ultrahigh vacuum based surface laboratory with facilities for thin film growth and analyses with X-ray induced photoemission (XPS), ultraviolet photoemission (UPS), Auger electron spectroscopy (AES), and ion scattering spectroscopy (ISS), together with low energy electron diffraction (LEED).
Group members:
Associate Professor, Eva Arnspang Christensen
Associate Professor Mathias Porsmose Clausen
Associate Professor Martin A. B. Hedegaard
Emeritus Per Morgen